Characterizing optical phase-change materials with spectroscopic ellipsometry and polarimetry

This paper discusses the fundamentals, applications, potential and limitations of polarized light reflection techniques for characterization phase-change materials (PCMs). These include spectroscopic ellipsometry, time-resolved ellipsometry imaging as well polarimetry. We explore capabilities in determination extinction coefficient PCMs to characterize PCMs. show that is capable more than thickness optical properties, it can be exploited gain information about crystallization/amorphization kinetics mapping anisotropies.